Your location:首页 > Product center > Probe station > Fully automatic/semi-automatic probe station > Automatic probe station series
Product category:
-
HXJ5N0 series automatic probe station
HXJ5N0 series automatic probe 4 inch, 5 inch wafer, including diode, transistor, MOSFET tube, photoelectric device, sensor and vertical structure chip measurement, optional multi-pin test function, can realize the requirements of multiple simultaneous measurement, improve the testing capacity of the machine。
View details -
HX8N0 series automatic probe station
The HX8N0 series of fully automatic probe table equipment is specialized for the performance testing of all kinds of devices at the wafer level of 8 inches，Can be tested against different wafers，Can be equipped with appropriate instruments，The characteristics of I-V, C-V and optical signals are analyzed，Equipment features，Can match a variety of test application environments，Can upgrade high-power wafer testing, RF testing, fully automatic testing and can load temperature control system，To meet customer requirements for various wafer device performance testing in high and low temperature environments。
View details -
HX5N0 series automatic probe station
HX5N0 series automatic probe table is a professional integrated and efficient automatic automatic wafer probe table，Have space savings，High efficiency and other features，Suitable for 4 - and 5-inch wafers，Inclusion diode，triode，Measurement of MOSFET tubes, optoelectronic devices, sensors and vertically structured chips，Optional multi-pin test function，It can realize the requirements of multiple measurement at the same time，Increase the testing capacity of the machine。
View details
- Page 1 / Total 1 page
