With the continuous development of electronic technology, for precision micro-electronic devices (nanoscale), to test its electrical properties (such as current, voltage, impedance, etc.) in low temperature environment or variable temperature environment, the low-temperature probe table equipped with a microscope can provide a good low-temperature electrical measurement environment。

Permanent magnet cryogenic probe station plays an important role in scientific research and technology development。It can perform a variety of non-destructive physical and electrical properties tests on samples at low temperatures, helping researchers to deeply understand the various physical and electrical properties of materials or devices, so as to provide important data support for the development and application of new materials。

The PSM-PM series Permanent magnet low temperature probe is a probe platform specially developed for low temperature vertical magnetic field electrical measurement environment, providing 0.The 5T vertical magnetic field can carry out repeatable and standard electrical experiments on 2-inch, 4-inch and wafer, and different external test equipment can complete the electrical characteristics measurement, parameter measurement, DC measurement, RF measurement and Hall measurement of the device。

Parameters and indicators: