The HSEM-06PS Room temperature variable field probe Hall test system provides a vertical variable magnetic field environment for 4 inch samples and devices to be tested。External connection Other electrical meters can perform non-destructive electrical testing of chips, wafers and devices at room temperature, such as current, voltage, resistance and other electrical signals under different magnetic fields。
System features:
• The sample holder can hold a 4-inch wafer sample and is secured by controlled gas adsorption using porous partitions。(Other sizes can be customized)
• Can provide variable magnetic field environment, magnetic field size ±0.6T
• 6 probe arms can be mounted
• The probe arm adopts magnet adsorption, can be moved arbitrarily, and can be fine-tuned in three dimensions for easy operation, precise needle insertion, the probe of the four probe arms can be inserted into any position of the sample。
• The probe arm adopts three coaxial cables and three coaxial connectors, and the leakage current is small, within 100fA
• CCD magnification is 180 times, working distance is 100mm
Test materials:
• Thermoelectric materials: bismuth telluride, lead telluride, silicon germanium alloy, etc
• Photovoltaic materials/solar cells: (A-silicon (monocrystalline silicon, amorphous silicon), CIGS (copper indium Gallium selenium), cadmium telluride, perovskite, etc.)
• Organic materials: (OFET, OLED)
• Transparent conductive metal oxide TCO: (ITO, AZO, ZnO, IGZO (Indium gallium zinc oxide), etc.)
• Semiconductor materials: SiGe, InAs, SiC, InGaAs, GaN, SiC, InP, ZnO, Ga2O3, etc
• 2D materials: graphene, BN, MoS2, etc
