The HX80N series semi-automatic probe table is a custom-made integrated probe table for sensor wafer testing with excellent test accuracy. It can be combined with customized instrumentation systems to perform tests such as photoelectric sensors, pressure sensors and gas sensors。

Software function introduction
• Can test wafer, test range is optional, support interlace sampling and ring test MAP can be edited test;
• Support bad point retest;
• With offline and synchronous functions;
• With contact buffer function, stable needle marks;
• Operation accuracy compensation function to ensure the stability of the test;
• Test yield, total, speed display;
• CCD image automatic alignment and positioning;
• The equipment has a certain anti-interference ability, support high and low temperature test, stable operation;
• Multi-bin classification test, test data can be stored, can be exported, compatible with the format of post-channel devices, with data statistical analysis function;
• Operator, administrator, system manufacturer rights management functions

Parameters and indicators: